ISO/IEC 10373-3:2010 pdf – Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices

ISO/IEC 10373-3:2010 pdf – Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices.
1 Scope This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications. NOTE Criteria for acceptability do not form part of this part of ISO/IEC 10373 but will be found in the International Standards mentioned above. This part of ISO/IEC 10373 defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts define other technology-specific tests. Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this part of ISO/IEC 10373 are based on ISO/IEC 7816-3. Conformance of cards and IFDs determined using the test methods defined in this part of ISO/IEC 10373 does not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC 10373. This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. Minimum functionality is defined as follows. ⎯ Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard. ⎯ Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies.
3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 card integrated circuit card with contacts as defined in ISO/IEC 7816 3.2 DUT device under test card or IFD that is subject to testing 3.3 etu-factor parameters negotiable by protocol and parameters selection (PPS), described in ISO/IEC 7816-3:2006, 6.3.1 3.4 IFD interface device related to integrated circuit cards with contacts as defined in ISO/IEC 7816-3 3.5 normal use use as an identification card, as defined in ISO/IEC 7810:2003, 4.1, involving equipment processes appropriate to the card technology and storage as a personal document between equipment processes 3.6 test method method for testing characteristics of identification cards and related interface devices for the purpose of confirming their compliance with International Standards 3.7 test scenario defined typical protocol and application specific communication to be used with the test methods defined in this part of ISO/IEC 10373 3.8 typical protocol and application specific communication communication between a DUT and the corresponding test-apparatus based on protocol and application implemented in the DUT and representing its normal use 4 General items applicable to the test methods 4.1 Test environment Unless otherwise specified, testing of physical, electrical and logical characteristics shall take place in an environment of temperature 23 °C ± 3 °C, of relative humidity 40 % to 60 %. 4.2 Pre-conditioning Where pre-conditioning is required by the test method, the identification cards to be tested shall be conditioned to the test environment for a period of 24 h before testing unless otherwise specified.
4.3 Selection of test methods Tests shall be applied as required to test the attributes of the card defined by the relevant base standard (see 4.8). 4.4 Default tolerance Unless otherwise specified, a default tolerance of ± 5 % shall be applied to the quantity values given to specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment adjustments). 4.5 Total measurement uncertainty The total measurement uncertainty for each quantity determined by these test methods shall be stated in the test report. 4.6 Conventions for electrical measurements Potential differences are defined with respect to the GND contact of the card and currents flowing to the card are considered positive. 4.7 Apparatus 4.7.1 Apparatus for testing the integrated circuit cards with contacts (card-test-apparatus) 4.7.1.1 Generating the VCC voltage (U CC ) and timing